ข้อมูลสัญลักษณ์จำแนกการออกแบบผลิตภัณฑ์ระหว่างประเทศ


รหัส / code คำอธิบาย / code name Version
H01J0037252000 Tubes for spot-analysing by electron or ion beams; Microanalysers 1
H01J0037256000 using scanning beams 1
H01J0037260000 Electron or ion microscopes; Electron- or ion-diffraction tubes 1
H01J0037270000 Shadow microscopy 1
H01J0037280000 with scanning beams 1
H01J0037285000 Emission microscopes, e.g. field-emission microscopes 1
H01J0037290000 Reflection microscopes 1
H01J0037295000 Electron- or ion-diffraction tubes 1
H01J0037300000 Electron-beam or ion-beam tubes for localised treatment of objects 1
H01J0037301000 Arrangements enabling beams to pass between regions of different pressure 1
H01J0037302000 Controlling tubes by external information, e.g. programme control (H01J0037304000 takes precedence);; 1
H01J0037304000 Controlling tubes by information coming from the objects, e.g. correction signals 1
H01J0037305000 for casting, melting, evaporating, or etching 1
H01J0037310000 for cutting or drilling 1
H01J0037315000 for welding 1