ข้อมูลสัญลักษณ์จำแนกการออกแบบผลิตภัณฑ์ระหว่างประเทศ


รหัส / code คำอธิบาย / code name Version
G11C0029100000 Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 1
G11C0029120000 Built-in arrangements for testing, e.g. built-in self testing [BIST] 1
G11C0029140000 Implementation of control logic, e.g. test mode decoders 1
G11C0029160000 using microprogrammed units, e.g. state machines 1
G11C0029180000 Address generation devices; Devices for accessing memories, e.g. details of addressing circuits 1
G11C0029200000 using counters or linear-feedback shift registers [LFSR] 1
G11C0029220000 Accessing serial memories 1
G11C0029240000 Accessing extra cells, e.g. dummy cells or redundant cells 1
G11C0029260000 Accessing multiple arrays (G11C0029240000 takes precedence);; 1
G11C0029280000 Dependent multiple arrays, e.g. multi-bit arrays 1
G11C0029300000 Accessing single arrays 1
G11C0029320000 Serial access; Scan testing 1
G11C0029340000 Accessing multiple bits simultaneously 1
G11C0029360000 Data generation devices, e.g. data inverters 1
G11C0029380000 Response verification devices 1