ข้อมูลสัญลักษณ์จำแนกการออกแบบผลิตภัณฑ์ระหว่างประเทศ


รหัส / code คำอธิบาย / code name Version
G01Q0060220000 Probes, their manufacture or their related instrumentation, e.g. holders 1
G01Q0060240000 AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes 1
G01Q0060260000 Friction force microscopy 1
G01Q0060280000 Adhesion force microscopy 1
G01Q0060300000 Scanning potential microscopy 1
G01Q0060320000 AC mode 1
G01Q0060340000 Tapping mode 1
G01Q0060360000 DC mode 1
G01Q0060380000 Probes, their manufacture or their related instrumentation, e.g. holders 1
G01Q0060400000 Conductive probes 1
G01Q0060420000 Functionalisation 1
G01Q0060440000 SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes 1
G01Q0060460000 SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes 1
G01Q0060480000 Probes, their manufacture or their related instrumentation, e.g. holders 1
G01Q0060500000 MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes 1